Reviewed Journals and Proceedings

  • Jan Thiesler et. al., “Novel nanopositioning system with improved range”, Proceedings of the 25th International Conference of the European Society for Precision Engineering and Nanotechnology 2025

Conferences

  • D. Leonard et al.,  THERMEC’25 30th June– 4th July 2025,  Topic: Smart/Intelligent Materials & Processes, keynote (oral) presentation
  • M. Ferrer et al.,- PERMolMat – 19th March 2025 – Japan-France Workshop on Photo-Electro-Responsive Molecules and Materials, Topic: Fluorescence Modulation by Cascade Effect in Photochromic Microcapsules, Poster presentation
  • M. Ferrer et al., – Journées Annuelles SP2P’25 – Annual Meeting of the Photochemistry, Photophysics and Photosciences Subdivision (SP2P) May 19-21 2025, Topic: Comparison of PAGs for deep-UV green photoresists based on Chistosan, Poster presentation
  • Gaoliang Dai et al., EUSPEN conference 9th – 13th June 2025, Topic: Novel hybrid interference and atomic force microscopy for in-situ reference areal surface metrology, Oral presentation
  • J. Thiesler et al., EUSPEN conference 9th – 13th  June 2025, Topic: Novel hybrid AI-PID controller, Poster
  • Gaoliang Dai et al., Taiwan‐GermanWorkshop on Optical Metrology conference, 05th March 2025, Topic: Overview of AFM-based techniques for accurate and traceable surface and nanodimensional metrology, Oral presentation
  • Gaoliang Dai et al., Technical Forum “Advanced Nanopositioningand Nanometrology for Precision Manufacturing and Processes” 06th March 2025, Topic: Hybrid nanopositioning system with improved range, dynamics and accuracy, Oral presentation
  • Gaoliang Dai et al., TSMC Precision Metrology Workshop 07th March 2025, Topic: A brief overview of reference nanometrology at PTB for supporting semiconductor industry, Oral presentation
  • Gaoliang Dai et al., Optical Technology and Measurement for Industrial Applications 2025 (OPTM2025) Conference 21th-25th April 2025, Topic: A novel hybrid interferometrical- and atomic force microscope, Oral presentation
  • Gaoliang Dai et al., 20th International Conference on Precision Engineering (ICPE2024) 23th-26th Oct 2024, Topic: A novel hybrid interferometrical- and atomic force microscope, Oral presentation
  • Gaoliang Dai et al., IMEKO 2024 26th-29th Aug 2024, Topic: Novel bottom-up traceability approach for calibrating geometries of tactile probes in dimensional metrology, Oral presentation
  • V. Constantoudis et al., NANOTEXNOLOGY 2025 08-10/07/2025, Topic: Machine learning approaches in materials characterization and soft matter molecular simulation: Challenges and Perspectives, Invited Talk
  • D. Leonard et al., Thermec 2025 conference June 30-July 4 2025, Topic: Formulation of chitosan-based resists for an optimized eco-efficient photolithography process: focus on the ToF-SIMS characterization, oral presentation